Journal of Computers (JCP, ISSN 1796-203X)
Copyright @ 2006-2012 by ACADEMY PUBLISHER – All rights reserved.
Ling Li
College of Automation, Nanjing University of Aeronautics and Astronautics
China
Ming Li
Key Laboratory of Nondestructive Testing (Ministry of Education), Nanchang Hangkong Univerity
China
Yuming Lu
Key Laboratory of Nondestructive Testing (Ministry of Education), Nanchang Hangkong Univerity
China
YongLiang Zhang
Key Laboratory of Nondestructive Testing (Ministry of Education), Nanchang Hangkong Univerity
China
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Journal of Computers (JCP, ISSN 1796-203X)
Copyright @ 2006-2012 by ACADEMY PUBLISHER – All rights reserved.