Journal of Computers, Vol 5, No 3 (2010), 337-344, Mar 2010
doi:10.4304/jcp.5.3.337-344

The Influence of the Nanometer Technology on Performance of CPL Full Adders

Abdoul M. Rjoub, AL-Mamoon Al-Othman

Abstract


 In this paper the performance of 8-transistor based Full adder is analyzed, evaluated, and compared with that of three different types of Full Adders based on Complementary Pass Transistor XOR Logic gate. Simulation results using nano-scale SPICE parameters are obtained for the above mentioned FAs. It is shown that the performance of the 8-transistor based Full adder in term of power dissipation is superior to that of the other FAs. Multi- Supply Voltage Technique is used to optimize the outputs of 8-Transistor Full Adder. A new technique based on minimum leakage vector is proposed to reduce the leakage current when the circuit is in its off state.



Keywords


Full Adder, Minimum Leakage Vector, Multi-Supply Voltage, Nano-Technology, Pass Transistor Logic, XOR logic gate

References



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Journal of Computers (JCP, ISSN 1796-203X)

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